Single-shot measurement of subpicosecond KrF pulse width by three-photon fluorescence of the XeF visible transition

Journal Article · Mon Oct 31 23:00:00 EST 1988 · Opt. Lett.; (United States)

DOI:https://doi.org/10.1364/OL.13.000996· OSTI ID:6747988

Sarukura, N; Watanabe, M; Endoh, A; Watanabe, S

The intensity of the XeF C--A transition induced by a subpicosecond KrF laser is shown to have a cubic dependence on KrF laser intensity. The third-order autocorrelation technique for measuring the duration of a single KrF subpicosecond pulse has been developed utilizing this visible transition. A pulse width of 220 fsec was successfully measured with a high contrast of approx.10. The visible fluorescence is more useful to researchers than vacuum-UV fluorescences. Furthermore, this simple technique may be applied over a wide UV wavelength region from 204 to 306 nm.

• Research Organization: Institute for Solid State Physics, University of Tokyo, Roppongi 7-22-1, Minato-ku, Tokyo 106, Japan
• OSTI ID: 6747988
• Journal Information: Opt. Lett.; (United States), Journal Name: Opt. Lett.; (United States) Vol. 13:11; ISSN OPLED
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420300* -- Engineering-- Lasers-- (-1989)
ELECTROMAGNETIC RADIATION
EXCIMER LASERS
EXTREME ULTRAVIOLET RADIATION
FLUORESCENCE
FLUORIDES
FLUORINE COMPOUNDS
GAS LASERS
HALIDES
HALOGEN COMPOUNDS
KRYPTON COMPOUNDS
KRYPTON FLUORIDE LASERS
KRYPTON FLUORIDES
LASER RADIATION
LASERS
LUMINESCENCE
OPERATION
PULSES
RADIATIONS
RARE GAS COMPOUNDS
ULTRAVIOLET RADIATION
XENON COMPOUNDS
XENON FLUORIDES