Characterization of the TEXTOR plasma edge using deposition probe techniques

Journal Article · Sun Apr 01 04:00:00 EST 1984 · J. Vac. Sci. Technol., A; (United States)

DOI:https://doi.org/10.1116/1.572428· OSTI ID:6745484

Zuhr, R A

Carbon and single crystal silicon passive deposition probes were used to measure the characteristics of the plasma edge region of the TEXTOR tokamak. Analysis of the probes was done by Rutherford backscattering for impurities and nuclear reaction analysis and elastic recoil detection for hydrogen isotopes. Plasma fluxes and energies in the edge were measured using these techniques. The principal impurities in the plasma edge were determined and their behavior as a function of time and position was measured. Measurements were also made of in situ erosion rates. The results are compared with independent measurements of other plasma parameters to study possible impurity introduction mechanisms.

• Research Organization: Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830
• DOE Contract Number: W-7405-ENG-26
• OSTI ID: 6745484
• Journal Information: J. Vac. Sci. Technol., A; (United States), Journal Name: J. Vac. Sci. Technol., A; (United States) Vol. 2:2; ISSN JVTAD
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700102 -- Fusion Energy-- Plasma Research-- Diagnostics
700104* -- Fusion Energy-- Plasma Research-- Plasma Kinetics-Experimental-- (-1987)
BACKSCATTERING
BOUNDARY LAYERS
CARBON
CHEMICAL REACTIONS
CLOSED PLASMA DEVICES
CORROSION
CRYSTALS
DEUTERIUM
DISTRIBUTION
ELEMENTS
ENERGY
HYDROGEN
HYDROGEN ISOTOPES
IMPURITIES
ISOTOPES
KINETICS
LAYERS
LIGHT NUCLEI
MONOCRYSTALS
NONMETALS
NUCLEI
ODD-ODD NUCLEI
PLASMA DIAGNOSTICS
PLASMA SCRAPE-OFF LAYER
PROBES
QUANTITY RATIO
SCATTERING
SEMIMETALS
SILICON
SPATIAL DISTRIBUTION
STABLE ISOTOPES
TEXTOR TOKAMAK
THERMONUCLEAR DEVICES
TOKAMAK DEVICES