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In-plane epitaxial alignment of YBa[sub 2]Cu[sub 3]O[sub 7[minus][ital x]] films grown on silver crystals and buffer layers

Journal Article · · Applied Physics Letters; (United States)
DOI:https://doi.org/10.1063/1.109565· OSTI ID:6738806
 [1]; ;  [2]
  1. Solid State Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831 (United States)
  2. Energy Conversion Devices Inc., Troy, Michigan 48084 (United States)
Superconducting YBa[sub 2]Cu[sub 3]O[sub 7[minus][ital x]] (YBCO) films were grown by laser ablation on Ag(001), Ag(110), and Ag(111) single-crystal surfaces. X-ray diffraction measurements showed that, in all cases, the films were aligned with specific in-plane epitaxial orientation with respect to the crystallographic axes of the substrate. The observed orientations were consistent with predictions of near-coincident site lattice models of the YBCO-Ag interface. This technique for achieving three-dimensional film alignment was extended to include a Ag epitaxial buffer layer on mica in place of a bulk Ag crystal. In-plane epitaxial alignment on metal substrates and buffer layers has important consequences in practical applications for inhibiting weak-link behavior caused by high-angle grain boundaries.
DOE Contract Number:
AC05-84OR21400
OSTI ID:
6738806
Journal Information:
Applied Physics Letters; (United States), Journal Name: Applied Physics Letters; (United States) Vol. 62:15; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English