Ion beam methods for the surface characterization of polymers. Final report Jan-Jul 81

Technical Report · Mon Feb 01 04:00:00 EST 1982

OSTI ID:6736220

Baun, W L

Ion beam methods of surface characterization have not been applied extensively to polymers and other organic materials, but would appear to be very useful for these materials. Applications of high energy ion beam methods would seem to be limited except for specific cases but low energy methods such as ion scattering spectrometry (ISS) and secondary ion mass spectrometry (SIMS) should have numerous uses with polymeric materials. ISS is a true surface method which determines elemental composition at the first monolayer, but tells little about how the elements are combined. SIMS has high sensitivity for many elements, and has the capability of determining something of the molecular structure near the surface. Both ISS and SIMS, as well as high energy methods, give elemental composition with depth. These surface spectroscopies are useful in many areas of polymer technology including synthesis, extrusion and forming, and long time durability and stability under thermal and electromagnetic radiation.

• Research Organization: Air Force Wright Aeronautical Labs., Wright-Patterson AFB, OH (USA)
• OSTI ID: 6736220
• Report Number(s): AD-A-114012/8
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360402 -- Polymers & Plastics-- Structure & Phase Studies-- (-1987)
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400103* -- Radiometric & Radiochemical Procedures-- (-1987)
BEAMS
CHEMICAL ANALYSIS
CLASSIFICATION
ELECTROMAGNETIC RADIATION
EMISSION
EXTRUSION
FABRICATION
ION BEAMS
ION SCATTERING ANALYSIS
LAYERS
MASS SPECTROSCOPY
MATERIALS WORKING
MOLECULAR STRUCTURE
NONDESTRUCTIVE ANALYSIS
POLYMERS
RADIATIONS
SCATTERING
SECONDARY EMISSION
SPECTROSCOPY
SURFACES
THERMAL RADIATION
USES