Towards fast transition radiation imaging detectors with CsI convertors

Conference · Sat Aug 01 04:00:00 EDT 1992 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6731040

Chechik, R; Breskin, A; Akkerman, A; Gibrekthterman, A; Aclander, H; Elkind, V ^[1]; Frumkin, I Z ^[2]

---

1. Weizmann Inst. of Science, Rehovoth (Israel). Dept. of Physics
2. Technion-Israel Inst. of Tech., Haifa (Israel)

In this paper, the authors present a new X-ray imaging method with a potential application to ultrarelativistic particle identification by Transition Radiation detection. It is based on the conversion of the X-ray photons in a thin layer of CsI and the amplification of secondary emitted electrons in a low-pressure multistep avalanche electron multiplier. The obvious advantages of the solid X-ray convertor are the parallax-free imaging and the ultrafast response. The authors present the experimental results on the detector performance with X-rays of 6-60 keV and with relativistic electrons. They are accompanied by mathematical modeling and Monte Carlo simulations of transition Radiation Detectors based on this novel technique.

• OSTI ID: 6731040
• Report Number(s): CONF-911106--
• Conference Information: Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 39:4
• Country of Publication: United States
• Language: English

Related Subjects

440104* -- Radiation Instrumentation-- High Energy Physics Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALKALI METAL COMPOUNDS
CALCULATION METHODS
CESIUM COMPOUNDS
CESIUM IODIDES
CHEMICAL ANALYSIS
DATA
ELECTRON MULTIPLIER DETECTORS
ENERGY RANGE
EXPERIMENTAL DATA
FILMS
HALIDES
HALOGEN COMPOUNDS
IMAGE PROCESSING
INFORMATION
INORGANIC PHOSPHORS
IODIDES
IODINE COMPOUNDS
KEV RANGE
KEV RANGE 01-10
KEV RANGE 10-100
MATHEMATICAL MODELS
MEASURING INSTRUMENTS
MONTE CARLO METHOD
NONDESTRUCTIVE ANALYSIS
NUMERICAL DATA
PERFORMANCE TESTING
PHOSPHORS
PROCESSING
RADIATION DETECTORS
TESTING
THIN FILMS
TRANSITION RADIATION DETECTORS
X-RAY EMISSION ANALYSIS