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A comparison of CaF[sub 2]:Mn thermoluminescent dosimeter chips to aluminum and silicon x-ray calorimeters in the pulsed Hermes III environment

Journal Article · · Review of Scientific Instruments; (United States)
DOI:https://doi.org/10.1063/1.1146274· OSTI ID:6727598
; ; ; ;  [1]; ;  [2]
  1. Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)
  2. Team Specialty Products, Inc., Albuquerque, New Mexico 87123 (United States)
+ Show Author Affiliations

Hermes III is a pulsed power, Bremsstrahlung simulator used for radiation-hardness testing of electronics components [19-MeV spectrum, 20-ns pulse duration, and typical doses (silicon) [le]100 krad (1 kGy)]. CaF[sub 2]:Mn thermoluminescent dosimeter chips (TLDs) have been compared to a set of x-ray calorimeters in the Hermes III environment for doses between 10--75 krad. Similar to a design reported by Murray and Attix, this set of detectors included different dosimetric materials (silicon and aluminum) and two independent temperature sensors (thermistors and thermocouples). The electronic recording system was also updated. The average disagreement between TLDs and calorimeters was 1%--3%. Radiation transport calculations, however, suggest a possible bias of 4%--6% (source unknown). With the [ital silicon] calorimeter the ac bridge, which measured the resistance of thermistor temperature sensors, was extremely sensitive to EMP.

OSTI ID:
6727598
Journal Information:
Review of Scientific Instruments; (United States), Journal Name: Review of Scientific Instruments; (United States) Vol. 66:1; ISSN 0034-6748; ISSN RSINAK
Country of Publication:
United States
Language:
English

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Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALKALINE EARTH METAL COMPOUNDS
ALUMINIUM
BREMSSTRAHLUNG
CALCIUM COMPOUNDS
CALCIUM FLUORIDES
CALCIUM HALIDES
CALORIMETERS
DESIGN
DOSEMETERS
ELECTROMAGNETIC RADIATION
ELEMENTS
EQUIPMENT
FLUORIDES
FLUORINE COMPOUNDS
HALIDES
HALOGEN COMPOUNDS
MEASURING INSTRUMENTS
METALS
PHYSICAL RADIATION EFFECTS
PLASMA DIAGNOSTICS
PLASMA SIMULATION
RADIATION EFFECTS
RADIATIONS
SEMIMETALS
SILICON
SIMULATION
X-RAY EQUIPMENT