A voltammetric study of compound formation in the Hg-Cd-Te system
- Texas Univ., Arlington, TX (USA). Dept. of Chemistry
The cathodic electrodeposition chemistry in the ternary Hg-Cd-Te system has been studied using hydrodynamic voltammetry in conjunction with cyclic photovoltammetry, x-ray diffraction (XRD) analyses, and optical measurements. The binary Hg-Te system was studied first, as a prelude to the more complex ternary case. An H{sub 2}SO{sub 4} electrolyte matrix was used in these studies. The Hg stripping waves observed on the return scan at the disk were altered in shape when the disk was scanned into the Te{sup 4 +} {r arrow} Te{degrees} and Te{sup 4 +} {r arrow} Te{sup 2 {minus}} regimes on the forward sweep. Monitoring of the ring response both at 1.40 V and 0 V permitted selective detection of Hg and Te species generated at the disk. Evidence for the kinetic sluggishness of HgTe compound formation is presented and contrasted with the CdTe case. In both the Hg-Te and Hg-Cd-Te cases,the broad anodic dissolution envelope at potentials positive of {approximately} 0.70 V (contrasting the clean stripping behavior of the individual components in isolation) was taken to be diagnostic of compound formation. The ring response at 1.40 V, which is tuned to Hg{sub 2}{sup 2 +} collection, is shown to be an effective indicator of the presence of free Hg in the electrodeposits. The presence of Cd{sup 2 +} ions and also a sequential deposition mode (Hg first followed by Te and Cd) appeared to facilitate quantitative conversion of elemental Hg. XRD data also show that Te formation (as a separate phase) is less of a problem with the Hg-Cd-Te system, again contrasting the situation with the Cd-Te case. Optical response and Auger electron spectroscopy measurements of the Hg-Cd-Te thin films indicate incomplete alloying of the HgTe and CdTe phases at room temperature.
- OSTI ID:
- 6725858
- Journal Information:
- Journal of the Electrochemical Society; (USA), Journal Name: Journal of the Electrochemical Society; (USA) Vol. 137:4; ISSN JESOA; ISSN 0013-4651
- Country of Publication:
- United States
- Language:
- English
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75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALLOY SYSTEMS
AUGER ELECTRON SPECTROSCOPY
CADMIUM
CADMIUM COMPOUNDS
CADMIUM TELLURIDES
CATHODE SPUTTERING
CHALCOGENIDES
COHERENT SCATTERING
DEPOSITION
DIFFRACTION
ELECTRODEPOSITION
ELECTROLYSIS
ELECTROLYTES
ELECTRON SPECTROSCOPY
ELEMENTS
FILMS
HYDROGEN COMPOUNDS
INORGANIC ACIDS
LYSIS
MERCURY
METALS
PHASE STUDIES
SCATTERING
SEMIMETALS
SPECTROSCOPY
SPUTTERING
SULFURIC ACID
SURFACE COATING
TELLURIDES
TELLURIUM
TELLURIUM COMPOUNDS
TERNARY ALLOY SYSTEMS
THIN FILMS
VOLTAMETRY
X-RAY DIFFRACTION