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Title: Expert system for testing industrial processes and determining sensor status

Patent ·
OSTI ID:672548

A method and system are disclosed for monitoring both an industrial process and a sensor. The method and system include determining a minimum number of sensor pairs needed to test the industrial process as well as the sensor for evaluating the state of operation of both. The technique further includes generating a first and second signal characteristic of an industrial process variable. After obtaining two signals associated with one physical variable, a difference function is obtained by determining the arithmetic difference between the pair of signals over time. A frequency domain transformation is made of the difference function to obtain Fourier modes describing a composite function. A residual function is obtained by subtracting the composite function from the difference function and the residual function (free of nonwhite noise) is analyzed by a statistical probability ratio test. 24 figs.

Research Organization:
Univ. of Chicago, IL (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
W-31109-ENG-38
Assignee:
Univ. of Chicago, IL (United States)
Patent Number(s):
US 5,761,090/A/
Application Number:
PAN: 8-541,602
OSTI ID:
672548
Resource Relation:
Other Information: PBD: 2 Jun 1998
Country of Publication:
United States
Language:
English