Artificial structure of Bi[sub 2]Sr[sub 2]CaCu[sub 2]O[sub y]/Bi[sub 2]Sr[sub 2]CuO[sub x]

Journal Article · Sun Feb 28 23:00:00 EST 1993 · Applied Physics Communications; (United States)

OSTI ID:6720726

Satoh, T; Setsune, K; Wasa, K ^[1]; Matsushima, T ^[2]

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1. Matsushita Electrical Industrial Co. Ltd., Moriguchi, Osaka (Japan)
2. Matsushita Electric Works, Ltd., Osaka (Japan)

Artificial structures of Bi[sub 2]Sr[sub 2]CaCu[sub 2]0[sub y](superconducting BSCCO)/ Bi[sub 2]Sr[sub 2]CuO[sub x] (normal conducting BSCO) multi-layered thin films by multitarget RF magnetron sputterings has been characterized by X-ray diffraction (XRD), secondary-ion mass spectroscopy (SIMS) and cross-sectional transmission electron microscopy (TEM). By the cross-sectional TEM and XRD, it was confirmed that the BSCCO/BSCO multilayers have the c-axis normal to the substrate surface. And that the compositional modulation of the BSCCO/BSCO multi-layer film was constructed as we designed.

• OSTI ID: 6720726
• Journal Information: Applied Physics Communications; (United States), Journal Name: Applied Physics Communications; (United States) Vol. 12:1; ISSN 0277-9374; ISSN APCODQ
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
ALKALINE EARTH METAL COMPOUNDS
BISMUTH COMPOUNDS
BISMUTH OXIDES
CALCIUM COMPOUNDS
CALCIUM OXIDES
CERAMICS
CHALCOGENIDES
COHERENT SCATTERING
COPPER COMPOUNDS
CUPRATES
DIFFRACTION
ELECTRON MICROSCOPY
FILMS
HIGH-TC SUPERCONDUCTORS
INTERFACES
MASS SPECTROSCOPY
MICROSCOPY
OXIDES
OXYGEN COMPOUNDS
SCATTERING
SPECTROSCOPY
STRONTIUM COMPOUNDS
STRONTIUM OXIDES
STRUCTURAL CHEMICAL ANALYSIS
SUPERCONDUCTORS
THIN FILMS
TRANSITION ELEMENT COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION