Soft x-ray absorption and emission spectra and the electronic structure of some exotic materials

Conference · Fri Jan 01 04:00:00 EST 1988

OSTI ID:6719593

Ederer, D L; Canfield, L R; Callcott, T A; Tsang, K L; Zhang, C H; Arakawa, E T

The technique of soft x-ray fluorescence spectroscopy (SXE) is complimentary to that of photoemission spectroscopy (PES). SXE probes the local partial density of states (PDOS), selects dipole allowed symmetries, and is not necessarily surface sensitive. PES on the other hand, averages over the DOS and can be used to measure the dispersion of the energy bands. PES is also very surface sensitive. We present measurements on the high T/sub c/ superconductors, the quasicrystalline phase of AlMn, and the LiAl intermetallic alloy. These measurements provide insight for theoretical modeling. In the case of the high T/sub c/ compound and the intermetallic compound the measurements are in good agreement with the theory. However, for the quasicrystals the measurements provide new insights to challenge theory. 13 refs., 3 figs.

• Research Organization: Oak Ridge National Lab., TN (USA)
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 6719593
• Report Number(s): CONF-8801115-1; ON: DE89001207
• Country of Publication: United States
• Language: English

Related Subjects

656003* -- Condensed Matter Physics-- Interactions between Beams & Condensed Matter-- (1987-)
656100 -- Condensed Matter Physics-- Superconductivity
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALLOYS
ALUMINIUM ALLOYS
ALUMINIUM BASE ALLOYS
CRITICAL TEMPERATURE
ELECTRONIC STRUCTURE
LITHIUM ALLOYS
LITHIUM BASE ALLOYS
PHYSICAL PROPERTIES
SPECTRA
SPECTROSCOPY
SUPERCONDUCTORS
THERMODYNAMIC PROPERTIES
TRANSITION TEMPERATURE
X-RAY SPECTRA
X-RAY SPECTROSCOPY