Resolution factors in the use of a double-pass CMA for ISS

Journal Article · Fri Sep 01 00:00:00 EDT 1978 · J. Vac. Sci. Technol.; (United States)

DOI:https://doi.org/10.1116/1.569842· OSTI ID:6715158

Ellis, W P; Taylor, T N

A double-pass CMA with a 90/sup 0/ ion gun is limited for ISS by the angular-dependent ion scattering energies. A 90/sup 0/ +- 2.3/sup 0/ aperture mask significantly improves the peak resolution for He/sup +//Au to 2% in ..delta..E/E from 7% in the unmasked mode. Although surface compositions of Ni/Cu alloys were still not resolvable with Ne/sup +/, Cu(amu 63.5) is separable from Fe(56) and As(75). As an adjunct to UPS studies, using the same analyzer, this approach is a valuable, additional capability .

• Research Organization: University of California, Los Alamos Scientific Laboratory, Los Alamos, New Mexico 87545
• OSTI ID: 6715158
• Journal Information: J. Vac. Sci. Technol.; (United States), Journal Name: J. Vac. Sci. Technol.; (United States) Vol. 15:5; ISSN JVSTA
• Country of Publication: United States
• Language: English

Related Subjects

640301* -- Atomic
Molecular & Chemical Physics-- Beams & their Reactions
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ARGON IONS
CHARGED PARTICLES
COLLISIONS
COPPER
ELEMENTS
ENERGY RANGE
ENERGY RESOLUTION
EV RANGE
EV RANGE 100-1000
GOLD
HELIUM IONS
ION COLLISIONS
ION SPECTROSCOPY
IONS
METALS
NEON IONS
NICKEL
RESOLUTION
SPECTROSCOPY
TRANSITION ELEMENTS