Soft x-ray spectroscopic study of a gas-puff z-pinch argon plasma
- Pohang Univ. of Science and Technology, Kyungbuk (Korea, Republic of). Physics Dept.
Z-pinch plasma has been widely studied as an intense pulsed light source in the soft X-ray region for various X-ray applications such as microscopy, lithography, and X-ray lasers. Here X-ray radiation characteristics of argon plasma produced by a gas-puff Z-pinch device were investigated using an X-ray crystal spectrometer, an X-ray diode, and an extreme ultraviolet (XUV) spectrometer. Using a germanium crystal the authors have observed spectral emission from Ar XVII produced by hot spots at the pinched stage. With the help of a 2-m grazing incidence XUV spectrometer, the spectrum of 30 to 250 {angstrom} were obtained. Strong lines from Ar VIII to Ar XIII were observed with a continuum whose peak is estimated to be about 23 joule which is about 0.6% of the electrical energy stored in capacitors.
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 669846
- Journal Information:
- IEEE Transactions on Plasma Science, Journal Name: IEEE Transactions on Plasma Science Journal Issue: 4 Vol. 26; ISSN ITPSBD; ISSN 0093-3813
- Country of Publication:
- United States
- Language:
- English
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