Soft x-ray spectroscopic study of a gas-puff z-pinch argon plasma

Journal Article · Sat Aug 01 04:00:00 EDT 1998 · IEEE Transactions on Plasma Science

DOI:https://doi.org/10.1109/27.725139· OSTI ID:669846

Kim, S H; Kim, D E; Lee, T N ^[1]

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1. Pohang Univ. of Science and Technology, Kyungbuk (Korea, Republic of). Physics Dept.

Z-pinch plasma has been widely studied as an intense pulsed light source in the soft X-ray region for various X-ray applications such as microscopy, lithography, and X-ray lasers. Here X-ray radiation characteristics of argon plasma produced by a gas-puff Z-pinch device were investigated using an X-ray crystal spectrometer, an X-ray diode, and an extreme ultraviolet (XUV) spectrometer. Using a germanium crystal the authors have observed spectral emission from Ar XVII produced by hot spots at the pinched stage. With the help of a 2-m grazing incidence XUV spectrometer, the spectrum of 30 to 250 {angstrom} were obtained. Strong lines from Ar VIII to Ar XIII were observed with a continuum whose peak is estimated to be about 23 joule which is about 0.6% of the electrical energy stored in capacitors.

• Sponsoring Organization: USDOE
• OSTI ID: 669846
• Journal Information: IEEE Transactions on Plasma Science, Journal Name: IEEE Transactions on Plasma Science Journal Issue: 4 Vol. 26; ISSN ITPSBD; ISSN 0093-3813
• Country of Publication: United States
• Language: English

Related Subjects

07 ISOTOPE AND RADIATION SOURCES
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
GAS INJECTION
LONGITUDINAL PINCH
PLASMA DIAGNOSTICS
SOFT X RADIATION
SPECTROSCOPY
X-RAY SOURCES