Analysis of time-of-flight spectra

Journal Article · Sun Jul 01 00:00:00 EDT 1990 · Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (USA)

DOI:https://doi.org/10.1116/1.576597· OSTI ID:6697463

Gibson, E M ^[1]; Foxon, C T ^[2]; Zhang, J ^[1]; Batey, J H ^[3]; Joyce, B A ^[1]

---

1. Interdisciplinary Research Centre for Semiconductor Materials, The Blackett Laboratory, Imperial College, London, SW7 2BZ (England)
2. Philips Research Laboratories, Redhill, Surrey, RH1 5HA (England)
3. VG Quadrupoles, Aston Way, Middlewich, Cheshire, CW10 0HS (England)

A simplified method of data analysis for time of flight measurements of the velocity of molecular beams sources is described. This method does not require the complex data fitting previously used in such studies. The method is applied to the study of Pb molecular beams from a true Knudsen source and has been used to show that a VG Quadrupoles SXP300H mass spectrometer, when fitted with an open cross-beam ionizer, acts as an ideal density detector over a wide range of operating conditions.

• OSTI ID: 6697463
• Journal Information: Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (USA), Vol. 8:4; ISSN 0734-2101
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
MOLECULAR BEAMS
VELOCITY
DATA ANALYSIS
DISTRIBUTION FUNCTIONS
ION TEMPERATURE
LEAD
MASS SPECTROMETERS
TIME-OF-FLIGHT METHOD
BEAMS
ELEMENTS
FUNCTIONS
MEASURING INSTRUMENTS
METALS
SPECTROMETERS
640302* - Atomic
Molecular & Chemical Physics- Atomic & Molecular Properties & Theory