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Variance reduction under exponential and scattering angle biasing: An analytic approach

Journal Article · · Nucl. Sci. Eng.; (United States)
OSTI ID:6694244
An analytic approach to calculate variance reduction under analog and biased Monte Carlo simulation of deep-penetration problems is presented. Within the framework of this formulation, the variance reduction characteristics of exponential biasing and a recently proposed scheme that couples exponential biasing to scattering angle biasing are studied. The advantages and disadvantages of the coupled scheme over exponential biasing on deep-penetration problems with varying scattering probability and anisotropy are clearly illustrated.
Research Organization:
Indira Gandhi Centre for Atomic Research, Reactor Physics Div., Kalpakkam 603 102, Tamil Nadu
OSTI ID:
6694244
Journal Information:
Nucl. Sci. Eng.; (United States), Journal Name: Nucl. Sci. Eng.; (United States) Vol. 94:4; ISSN NSENA
Country of Publication:
United States
Language:
English