XeF ground-state dynamics in a laser discharge

Journal Article · Fri Dec 01 04:00:00 EST 1978 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.90220· OSTI ID:6692429

Fulghum, S F; Herman, I P; Feld, M S; Javan, A

The time evolution of gain and absorption in an XeF laser discharge is studied using a pulsed uv dye-laser probe and timing system with +- 7-nsec resolution. The dissociation rate of the lowest vibrational level of the XeF ground state as a function of helium buffer pressure is found to have a slope of 1 x 10/sup 4/ sec/sup -1/ Torr/sup -1/ ( +- 15%).

• Research Organization: Department of Physics and Spectroscopy Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
• OSTI ID: 6692429
• Journal Information: Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 33:11; ISSN APPLA
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420300* -- Engineering-- Lasers-- (-1989)
CRYOGENIC FLUIDS
DISSOCIATION
EFFICIENCY
ELECTRIC DISCHARGES
ELEMENTS
ENERGY LEVELS
ENERGY TRANSFER
ENERGY-LEVEL TRANSITIONS
EXCITED STATES
FLUIDS
FLUORESCENCE
FLUORIDES
FLUORINE COMPOUNDS
GAS LASERS
GROUND STATES
HALIDES
HALOGEN COMPOUNDS
HELIUM
LASERS
LUMINESCENCE
NONMETALS
PRESSURE DEPENDENCE
RARE GAS COMPOUNDS
RARE GASES
VIBRATIONAL STATES
XENON COMPOUNDS
XENON FLUORIDES