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Penetration depth [lambda]([ital T]) of YBa[sub 2]Cu[sub 3]O[sub 7[minus][delta]] films determined from the kinetic inductance

Journal Article · · Applied Physics Letters; (United States)
DOI:https://doi.org/10.1063/1.109383· OSTI ID:6676189
;  [1]
  1. Department of Physics, The Ohio State University, Columbus, Ohio 43210 (United States)
We examine the temperature dependence of the magnetic penetration depth [lambda]([ital T]) of YBa[sub 2]Cu[sub 3]O[sub 7[minus][delta]], determined from the kinetic inductance of a film patterned into a long meander line. This technique has sufficient sensitivity to study [lambda]([ital T]) to lower temperatures than have been examined previously. A numerical model which includes both the magnetic and kinetic inductances of the samples extracts [lambda]([ital T]) from the measured voltage. In reasonable agreement with other measurements, [lambda](0)[approx]2100 A is deduced from fitting [lambda](0)[sup 2]/[lambda]([ital T])[sup 2] to the function 1[minus]([ital T]/[ital T][sub [ital c]])[sup 2] for [ital T]/[ital T][sub [ital c]][ge]0.4. We find [lambda]([ital T])/[lambda](0)[minus]1 is proportional to ([ital T]/[ital T][sub [ital c]])[sup 2] for 0.06 [le][ital T]/[ital T][sub [ital c]][le]0.4.
DOE Contract Number:
FG02-90ER45427
OSTI ID:
6676189
Journal Information:
Applied Physics Letters; (United States), Journal Name: Applied Physics Letters; (United States) Vol. 62:19; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English