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Newly developed low-temperature scanning tunneling microscope and its application to the study of superconducting materials

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States)
DOI:https://doi.org/10.1116/1.587582· OSTI ID:6667529
; ; ; ;  [1]; ; ; ;  [2]
  1. Institute of Chemistry, Chinese Academy of Sciences, Beijing 100080 (China)
  2. Institute of Physics, Chinese Academy of Sciences, Beijing 100080 (China)
A newly developed scanning tunneling microscope (STM) capable of operating at room temperature, 77 K, and 4.2 K is presented. This compact STM has a highly symmetric and rigid tunneling unit designed as an integral frame except the coarse and fine adjustment parts. The tunneling unit is incorporated into a small vacuum chamber that is usually pumped down to 2[times]10[sup [minus]4] Pa to avoid water contamination. The fine mechanic adjustment makes the tip approach the sample in 5 nm steps. The coarse adjustment not only changes the distance between the tip and the sample, but also adjusts the tip to be normal to the surface of the sample. With this low-temperature STM atomic resolution images of Bi-2212 single-crystal and large-scale topographies of a YBa[sub 2]Cu[sub 3]O[sub 7] thin film are observed at 77 K.
OSTI ID:
6667529
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States), Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States) Vol. 12:3; ISSN 0734-211X; ISSN JVTBD9
Country of Publication:
United States
Language:
English