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Title: Reply to ''Comments on 'Direct experimental determination of voltage across high-low junctions' '' (J. Appl. Phys. 59, 285 (1985))

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.337907· OSTI ID:6666184

Bellone, Caruso, and Vitale (J. Appl. Phys. 61,square-solidsquare-solidsquare-solidsquare-solid(1987)) dispute our assumption of an ohmic contact formed by the metal-semiconductor junctions to the low-doped region of a back-surface-field solar cell. Attention is drawn to the mechanism that can lead to an ohmic contact in our experiment. Experimental evidence cited in our paper and additional test data presented here show that the assumption of an ohmic contact is indeed valid. It is pointed out that our work has mainly focused on the alteration of the solar-cell structure only slightly to experimentally assess an aspect of the solar-cell theory. The overlapping part of the two studies were done independently.

Research Organization:
Jet Propulsion Laboratory, California Institute of Technology, 4800 Oak Grove Drive, Pasadena, California 91109
OSTI ID:
6666184
Journal Information:
J. Appl. Phys.; (United States), Vol. 61:7
Country of Publication:
United States
Language:
English