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Electronic and optical properties of amorphous Si:H films deposited by chemical vapor deposition

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.93414· OSTI ID:6656944
Doping properties, optical absorption, and infrared (IR) spectra of amorphous Si:H(a-Si:H) films prepared by chemical vapor deposition (CVD) of Si/sub 2/H/sub 6/ are reported. The optical absorption curves are very sharp and they indicate that the band gap of CVD a-Si:H can be changed substantially by varying the deposition temperature. A band gap of 1.5 eV has been achieved. IR spectra indicate the presence of Si--H and SiH/sub 2/ bonds, but H content is less than in device-quality glow-discharge deposited a-Si:H. The activation energy of undoped films is 0.6 eV. n-type doping can be achieved by PH/sub 3/ doping and the activation energy reduces to 0.12 eV upon doping. Photoinduced changes in electron trapping (Staebler--Wronski effect) are small in CVD a-Si:H films.
Research Organization:
Chronar Corporation, Princeton, New Jersey 08540
OSTI ID:
6656944
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 41:12; ISSN APPLA
Country of Publication:
United States
Language:
English