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Design of an X-ray FEL undulator

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.54426· OSTI ID:664853
 [1]
  1. Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, Stanford, California94309 (United States)
An undulator designed to be used for an x-ray free electron laser has to meet a set of stringent requirements. With no optical cavity, an x-ray FEL operates in the single pass Self Amplified Spontaneous Emission (SASE) mode; an electron macropulse is microbunched by an undulator and the radiation it creates. The microbunched pulse emits spontaneous radiation and coherent FEL radiation, whose power may reach saturation in a sufficiently long and perfect undulator. The pulse must have low emittance and high current, and its trajectory in the undulator must keep the radiation and the pulse together with a very high degree of overlap. In this paper we use the case of the Linear Coherent Light Source (LCLS) x-ray free electron laser to illustrate design concepts for long free electron laser undulators. The LCLS is intended to create 1.5 {Angstrom} x-rays using an electron beam with 15 GeV energy, 1.5{pi} mm-mrad normalized emittance, 3400 A peak current, and 280 fsec FWHM bunch duration. According to our simulations, this 2{sigma}{sub r}=65mmrms diameter beam must overlap its radiation with a walkoff of no more than 5 {mu}m RMS per 11.7 meter field gain length for efficient gain. The energy spread of the beam is {sigma}{sub E}=0.0002E{sub e}. This places severe limitations on the magnetic field errors and on mechanical tolerances. In this paper we shall discuss how to meet these requirements. {copyright} {ital 1997 American Institute of Physics.}
Research Organization:
Stanford Linear Accelerator Center
Sponsoring Organization:
USDOE
DOE Contract Number:
AC03-76SF00515
OSTI ID:
664853
Report Number(s):
CONF-9706244--
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 413; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English

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