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Title: Single event effects and performance predictions for space applications of RISC processors

Abstract

Proton and ion Single Event Phenomena (SEP) tests were performed on 32-b processors including R3000A's from all commercial manufacturers along with the Performance PR3400 family, Integrated Device Technology Inc. 79R3081, LSI Logic Corporation LR33000HC, and Intel i80960MX parts. The microprocessors had acceptable upset rates for operation in a low earth orbit or a lunar mission such as CLEMENTINE with a wide range in proton total dose failure. Even though R3000A devices are 60% smaller in physical area than R3000 devices, there was a 340% increase in device Single Event Upset (SEU) cross section. Software tests of varying complexity demonstrate that registers and other functional blocks using register architecture dominate the cross section. The current approach of giving a single upset cross section can lead to erroneous upset rates depending on the application software.

Authors:
; ; ; ; ;  [1];  [2];  [3];  [4]; ;  [5]
  1. (Lawrence Livermore National Lab., CA (United States))
  2. (JAYCOR, San Diego, CA (United States))
  3. (Crocker Nuclar Lab., Davis, CA (United States))
  4. (Aerospace Corp., El Segundo, CA (United States))
  5. (Los Alamos National Lab., NM (United States))
Publication Date:
OSTI Identifier:
6645462
Alternate Identifier(s):
OSTI ID: 6645462
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Journal Article
Journal Name:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
Additional Journal Information:
Journal Volume: 41:6Pt2; Journal ID: ISSN 0018-9499
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; MICROPROCESSORS; PHYSICAL RADIATION EFFECTS; INTEGRATED CIRCUITS; PERFORMANCE TESTING; RADIATION HARDENING; SPACE FLIGHT; COMPUTERS; ELECTRONIC CIRCUITS; HARDENING; MICROELECTRONIC CIRCUITS; RADIATION EFFECTS; TESTING 440200* -- Radiation Effects on Instrument Components, Instruments, or Electronic Systems

Citation Formats

Kimbrough, J.R., Colella, N.J., Denton, S.M., Shaeffer, D.L., Shih, D., Wilburn, J.W., Coakley, P.G., Casteneda, C., Koga, R., Clark, D.A., and Ullmann, J.L. Single event effects and performance predictions for space applications of RISC processors. United States: N. p., 1994. Web. doi:10.1109/23.340637.
Kimbrough, J.R., Colella, N.J., Denton, S.M., Shaeffer, D.L., Shih, D., Wilburn, J.W., Coakley, P.G., Casteneda, C., Koga, R., Clark, D.A., & Ullmann, J.L. Single event effects and performance predictions for space applications of RISC processors. United States. doi:10.1109/23.340637.
Kimbrough, J.R., Colella, N.J., Denton, S.M., Shaeffer, D.L., Shih, D., Wilburn, J.W., Coakley, P.G., Casteneda, C., Koga, R., Clark, D.A., and Ullmann, J.L. Thu . "Single event effects and performance predictions for space applications of RISC processors". United States. doi:10.1109/23.340637.
@article{osti_6645462,
title = {Single event effects and performance predictions for space applications of RISC processors},
author = {Kimbrough, J.R. and Colella, N.J. and Denton, S.M. and Shaeffer, D.L. and Shih, D. and Wilburn, J.W. and Coakley, P.G. and Casteneda, C. and Koga, R. and Clark, D.A. and Ullmann, J.L.},
abstractNote = {Proton and ion Single Event Phenomena (SEP) tests were performed on 32-b processors including R3000A's from all commercial manufacturers along with the Performance PR3400 family, Integrated Device Technology Inc. 79R3081, LSI Logic Corporation LR33000HC, and Intel i80960MX parts. The microprocessors had acceptable upset rates for operation in a low earth orbit or a lunar mission such as CLEMENTINE with a wide range in proton total dose failure. Even though R3000A devices are 60% smaller in physical area than R3000 devices, there was a 340% increase in device Single Event Upset (SEU) cross section. Software tests of varying complexity demonstrate that registers and other functional blocks using register architecture dominate the cross section. The current approach of giving a single upset cross section can lead to erroneous upset rates depending on the application software.},
doi = {10.1109/23.340637},
journal = {IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)},
issn = {0018-9499},
number = ,
volume = 41:6Pt2,
place = {United States},
year = {1994},
month = {12}
}