Laboratory x-ray spectrometer for EXAFS and XANES measurements

Journal Article · Tue Feb 01 04:00:00 EST 1983 · Rev. Sci. Instrum.; (United States)

DOI:https://doi.org/10.1063/1.1137344· OSTI ID:6624903

Williams, A

An in-lab x-ray spectrometer is described which is capable of rapid acquisition of x-ray absorption fine structure data for either extended x-ray absorption fine structure measurements (EXAFS), or x-ray absorption near edge structure studies (XANES). Intensities in excess of 10/sup 7/ photons/s in an approx.10 eV bandpass near 9 keV have been obtained using only a conventional sealed, fixed anode x-ray tube operating at 1.5 kW. The spectrometer utilizes a focusing Johansson cut and bent single crystal as the monochromator and scans continuously from 8< or approx. =2theta< or approx. =160 degrees with only a single stepping motor driven movement. For 3d metal absorption edges, resolutions of approx.10eV are obtained in first order with a Ge(111) crystal and approx.1 eV in third order allowing in-lab acquisition of both EXAFS and XANES data of synchrotron-like quality.

• Research Organization: W. M. Keck Laboratory of Engineering Materials, California Institute of Technology, Pasadena, California 91125
• DOE Contract Number: AT03-81ER10870; AM03-76SF00767
• OSTI ID: 6624903
• Journal Information: Rev. Sci. Instrum.; (United States), Journal Name: Rev. Sci. Instrum.; (United States) Vol. 54:2; ISSN RSINA
• Country of Publication: United States
• Language: English

Related Subjects

440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
ABSORPTION
ANODES
BREMSSTRAHLUNG
CRYSTAL LATTICES
CRYSTAL STRUCTURE
CRYSTALS
DATA ACQUISITION
DESIGN
ELECTRODES
ELECTROMAGNETIC RADIATION
ELECTRON TUBES
EQUIPMENT
FOCUSING
MEASURING INSTRUMENTS
MONOCHROMATORS
MONOCRYSTALS
ORIENTATION
RADIATIONS
RESOLUTION
SPECTROMETERS
SYNCHROTRON RADIATION
X-RAY EQUIPMENT
X-RAY SPECTROMETERS
X-RAY TUBES