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Diagnostics for the APS undulator test line

Conference · · AIP Conference Proceedings (American Institute of Physics); (United States)
DOI:https://doi.org/10.1063/1.46964· OSTI ID:6614750
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  1. Accelerator Systems Division, Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
One of the research and development thrusts at the Advanced Photon Source (APS) is to use an rf gun as a low-emittance electron source for injection into the 100- to 650-MeV linac subsystem and subsequent transport to an undulator test area. This configuration would combine the acceleration capability of the 200-MeV S-band electron linac and the in-line 450-MeV positron linac that normally provide positrons to the positron accumulator ring (PAR). A transport line that bypasses the PAR will bring the electrons to the undulator test area. Characterization techniques will be discussed for the electron beam with a normalized, rms emittance of [lt]10 [pi] mm mrad (1[sigma]) at micropulse charges of up to 350 pC and micropulse durations of [similar to]5 ps (FWHM). Preservation of such beam properties, will be critical. The diagnostics planned, with resolutions in parentheses, include the beam position monitors based on stripline pickups (100 [mu]m), current monitors based on a transformer (60 [mu]A), beam profile monitors (25 [mu]m FWHM), and bunch length monitor based on a streak camera (2 ps). Tests proposed include measurement of particle beam transport effects (at one-tenth the storage ring beam rigidity) caused by small undulator field errors.
Research Organization:
Argonne National Laboratory (ANL), Argonne, IL
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
6614750
Report Number(s):
CONF-9310204--
Conference Information:
Journal Name: AIP Conference Proceedings (American Institute of Physics); (United States) Journal Volume: 319:1
Country of Publication:
United States
Language:
English