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Scintillation characteristics of pure and Tl-doped CsI crystals

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)
OSTI ID:6610134
;  [1];  [2]
  1. R.J. Van de Graaff Lab., Univ. of Utrecht, P.O Box 80.000, 3508 TA Utrecht (NL)
  2. Delft Univ. of Technology (NL)

The scintillation characteristics of pure and Tl-doped CsI have been investigated. The scintillation light was detected with photomultipliers and silicon photodiodes. The influence of the Tl concentration on the light yield and on the decay times was studied upon excitation with {gamma}-rays and {alpha}-particles. The origin of the different emission components is discussed.

OSTI ID:
6610134
Report Number(s):
CONF-900143--
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) Vol. 37:2; ISSN 0018-9499; ISSN IETNA
Country of Publication:
United States
Language:
English