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Title: Simple method for focusing x rays using tapered capillaries

Journal Article · · Appl. Opt.; (United States)
DOI:https://doi.org/10.1364/AO.27.005135· OSTI ID:6608897

A new method of focusing x rays is described using appropriately tapered capillaries. The x rays are incident on the inner surface of the capillary below the critical glancing angle and reflect due to total external reflection. By appropriately narrowing the capillary, the x rays can thus be focused in a broad band of energies. The theory of the effect and optimum taper is described. A measurement verifying the focusing capability of the method is presented. The method appears practical for focusing bending magnet synchrotron radiation around 8 keV down to a diameter of 10 ..mu..m from an initial dimension of 1-mm/sup 2/ incident cross section with an attenuation of the total energy of approx.2, i.e., an increase in the intensity per unit area of 6.5 x 10/sup 3/. Greater focusing is possible with softer x rays and from undulator sources. The wide-ranging applicability of the technique is discussed.

Research Organization:
Hebrew University, Department of Applied Physics, Jerusalem 91904, Israel
OSTI ID:
6608897
Journal Information:
Appl. Opt.; (United States), Vol. 27:24
Country of Publication:
United States
Language:
English