Simple method for focusing x rays using tapered capillaries
A new method of focusing x rays is described using appropriately tapered capillaries. The x rays are incident on the inner surface of the capillary below the critical glancing angle and reflect due to total external reflection. By appropriately narrowing the capillary, the x rays can thus be focused in a broad band of energies. The theory of the effect and optimum taper is described. A measurement verifying the focusing capability of the method is presented. The method appears practical for focusing bending magnet synchrotron radiation around 8 keV down to a diameter of 10 ..mu..m from an initial dimension of 1-mm/sup 2/ incident cross section with an attenuation of the total energy of approx.2, i.e., an increase in the intensity per unit area of 6.5 x 10/sup 3/. Greater focusing is possible with softer x rays and from undulator sources. The wide-ranging applicability of the technique is discussed.
- Research Organization:
- Hebrew University, Department of Applied Physics, Jerusalem 91904, Israel
- OSTI ID:
- 6608897
- Journal Information:
- Appl. Opt.; (United States), Vol. 27:24
- Country of Publication:
- United States
- Language:
- English
Similar Records
Micro-XAS Using Tapered Capillary Concentrating Optics
Capillary optics for radiation focusing
Related Subjects
SOFT X RADIATION
FOCUSING
SYNCHROTRON RADIATION
X-RAY EQUIPMENT
CAPILLARIES
KEV RANGE 01-10
LIGHT PIPES
BLOOD VESSELS
BODY
BREMSSTRAHLUNG
CARDIOVASCULAR SYSTEM
ELECTROMAGNETIC RADIATION
ENERGY RANGE
EQUIPMENT
IONIZING RADIATIONS
KEV RANGE
ORGANS
RADIATIONS
X RADIATION
440100* - Radiation Instrumentation