Test and evaluation of infrared detectors and arrays; Proceedings of the Meeting, Orlando, FL, Mar. 27-29, 1989
Papers on the testing and evaluation of IR detectors and arrays are presented, covering topics such as a short wavelength IR test system, pulse height analysis, the use of an expert system for IR detector testing, low-background IR focal plane testing, electron beam testing, high performance silicide Schottky photodiodes, the SDI organization focal plane test program, the absorption cross section of arsenic in silicon, and long wavelength IR hybrids. Other topics include low background radiometric detector measurements, an ultralow background dewar for IR detector characterization studies, a computer assisted mosaic array test station, a configurable detector array test station, automated detector material characterization capabilities, and a test system for mercury cadmium telluride photoconductor arrays. Additional topics include ionization dosimetry measurements inside a dewar for linac electron and californium-252 neutron environments, a radiation test facility using a variable-flux electron beam source, automated visual inspection of IR focal plane arrays, a titanium cryostat for low temperature radiation effects studies, a low dose rate gamma test facility, and the test and evaluation of stability in IR staring focal plane arrays after nonuniformity correction.
- OSTI ID:
- 6606172
- Report Number(s):
- CONF-890369-
- Resource Relation:
- Conference: Future infrared detector materials, Orlando, FL (USA), 29-30 Mar 1989; Related Information: SPIE Proceedings. Volume 1108
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
INFRARED RADIATION
RADIATION DETECTION
RADIATION DETECTORS
PERFORMANCE TESTING
ABSORPTION
AMPLITUDES
CRYOGENICS
ELECTRON BEAMS
ELECTRONIC EQUIPMENT
EXPERT SYSTEMS
GAMMA RADIATION
LEADING ABSTRACT
MEETINGS
PHOTOCONDUCTORS
PHYSICAL RADIATION EFFECTS
RADIOMETERS
SCHOTTKY BARRIER DIODES
SILICIDES
ABSTRACTS
BEAMS
DETECTION
DOCUMENT TYPES
ELECTROMAGNETIC RADIATION
EQUIPMENT
IONIZING RADIATIONS
LEPTON BEAMS
MEASURING INSTRUMENTS
PARTICLE BEAMS
RADIATION EFFECTS
RADIATIONS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SILICON COMPOUNDS
TESTING
440500* - Thermal Instrumentation- (1990-)