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Title: Improved instrumentation to carry out surface analysis and to monitor chemical surface reactions in situ on small area catalysts over a wide pressure range (10/sup -8/--10/sup 5/ Torr)

Journal Article · · Rev. Sci. Instrum.; (United States)
DOI:https://doi.org/10.1063/1.1136899· OSTI ID:6587476

Improved one-tier and two-tier designs for a high-pressure--low-pressure (HPLP) apparatus are described together with some of their recent applications. These instruments are used for surface analysis and in situ monitoring of catalytic reactions on small samples with a geometrical surface area of 1 cm/sup 2/. Catalytic reactions are studied over a wide range of pressures (10/sup -8/--10/sup 5/ Torr) and temperatures (273--1273 K). The apparatus incorporates surface analysis methods such as Electron Spectroscopy for Chemical Analysis (ESCA), High Resolution Electron Energy Loss Spectrometry (HREELS), and /sup 14/C-radiotracer labeling in addition to Low Energy Electron Diffraction (LEED), Auger Electron Spectroscopy (AES), and mass spectrometry. Facilities are also available for argon sputter-ion cleaning, deposition of adsorbates by evaporation, and coverage calibration by means of a thickness monitor.

Research Organization:
Materials and Molecular Research Division, Lawrence Berkeley Laboratory and the Department of Chemistry, University of California, Berkeley, California 94720
OSTI ID:
6587476
Journal Information:
Rev. Sci. Instrum.; (United States), Vol. 53:12
Country of Publication:
United States
Language:
English