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Title: Filtered x-ray diode diagnostics fielded on the Z-accelerator for source power measurements

Conference ·
OSTI ID:658409

Filtered x-ray diode, (XRD), detectors are used as primary radiation flux diagnostics on Sandia`s Z-accelerator, which generates nominally a 200 TW, 2 MJ, x-ray pulse. Given such flux levels and XRD sensitivities the detectors are being fielded 23 meters from the source. The standard diagnostic setup and sensitivities are discussed. Vitreous carbon photocathodes are being used to reduce the effect of hydrocarbon contamination present in the Z-machine vacuum system. Nevertheless pre- and post-calibration data taken indicate spectrally dependent changes in the sensitivity of these detectors by up to factors up to 2 or 3.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
658409
Report Number(s):
SAND-98-0394C; CONF-980605-; ON: DE98005528; BR: DP0102012; TRN: 98:011237
Resource Relation:
Conference: 12. topical conference on high-temperature plasma diagnostics, Princeton, NJ (United States), 7-11 Jun 1998; Other Information: PBD: 2 Jun 1998
Country of Publication:
United States
Language:
English

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