Tunable multilayer EUV/soft x-ray polarimeter

Journal Article · Wed Feb 01 00:00:00 EST 1995 · Review of Scientific Instruments; (United States)

DOI:https://doi.org/10.1063/1.1146468· OSTI ID:6579252

Kortright, J B; Rice, M; Franck, K D ^[1]

---

1. Center for X-Ray Optics, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)

A tunable polarimeter using multilayer interference coatings as both reflection polarizer and transmission phase retarder is described. The portable device bolts onto existing chambers and its rotation axis is precisely aligned to the beam. The upstream transmission phase retarder is tunable by varying its incidence angle, and the downstream polarizer is tunable by translating a laterally graded multilayer. These optical components allow an unambiguous determination of the polarization state of any collimated beam entering the device over at least the 50--800 eV range.

• DOE Contract Number: AC03-76SF00098
• OSTI ID: 6579252
• Journal Information: Review of Scientific Instruments; (United States), Vol. 66:2; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
POLARIMETERS
DESIGN
EXTREME ULTRAVIOLET RADIATION
INCIDENCE ANGLE
INTERFERENCE
LAYERS
SOFT X RADIATION
ELECTROMAGNETIC RADIATION
IONIZING RADIATIONS
RADIATIONS
ULTRAVIOLET RADIATION
X RADIATION
661200* - Techniques of General Use in Physics- (1992-)