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Weak localization, fluctuation, and superconductivity in thin Nb films and wires

Journal Article · · Physical Review, B: Condensed Matter; (USA)
; ;  [1];  [2]
  1. Nippon Telegraph and Telephone Corporation, Opto-Electronics Laboratories, Tokai, Ibaraki 319-11 (Japan)
  2. Nippon Telegraph and Telephone Corporation, Basic Research Laboratories, Musashino, Tokyo 180 (Japan)
Weak localization, fluctuation conductivity, and related problems have been investigated based on a comprehensive set of experiments on transition metal Nb films and wires. The temperature dependence of the inelastic scattering rate 1/{tau}{sub {phi}} of films with various thicknesses (25--80 A), estimated from magnetoresistance data above {Tc}, is well fitted to a function of {ital C}{sub 0}+{ital C}{sub 1}{ital T}+{ital C}{sub 3}{ital T}{sup 3}. The coefficient {ital C}{sub 1} is in excellent quantitative agreement with the theoretical prediction of the electron-electron scattering mechanism for two-dimensional dirty metals. The coefficient {ital C}{sub 3} shows no thickness dependence and is in semiquantitative agreement with theories of three-dimensional electron-phonon scattering mechanisms. The upper critical field of thin Nb wires with a width of less than 1000 A exhibits unconventional temperature dependence close to {Tc}. We also discuss this behavior.
OSTI ID:
6565737
Journal Information:
Physical Review, B: Condensed Matter; (USA), Journal Name: Physical Review, B: Condensed Matter; (USA) Vol. 42:1; ISSN PRBMD; ISSN 0163-1829
Country of Publication:
United States
Language:
English