Enrichment depth profiles in polymer blends measured by forward recoil spectrometry

Journal Article · Sun Feb 05 23:00:00 EST 1989 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.100888· OSTI ID:6560700

Sokolov, J; Rafailovich, M H; Jones, R A.L.; Kramer, E J

A novel time-of-flight detector system for He/sup +/ forward recoil spectrometry which improves the depth resolution to better than 35 nm has been used to investigate the form of the surface enrichment profile in a protonated (normal) polystyrene (PS)/deuterated polystyrene (d-PS) blend. The volume fraction phi of d-PS depends on the depth z as phi(z) = phi/sub infinity/+(phi/sub 1/-phi/sub infinity/) exp(-z/xi), where phi/sub 1/ and phi/sub infinity/ are the surface and bulk volume fractions of d-PS, respectively, and xi is approximately the bulk correlation length, as predicted by theory.

• Research Organization: Department of Applied Science, Brookhaven National Laboratory, Upton, New York 11973
• OSTI ID: 6560700
• Journal Information: Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 54:6; ISSN APPLA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360603 -- Materials-- Properties
440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
CHARGED PARTICLES
CHEMICAL COMPOSITION
CONTAMINATION
DESIGN
FABRICATION
HELIUM IONS
IMPURITIES
ION SPECTROSCOPY
IONS
MATERIALS
MEASURING INSTRUMENTS
ORGANIC COMPOUNDS
ORGANIC POLYMERS
PETROCHEMICALS
PETROLEUM PRODUCTS
PLASTICS
POLYMERS
POLYOLEFINS
POLYSTYRENE
POLYVINYLS
RESOLUTION
SPECTROMETERS
SPECTROSCOPY
SURFACE CONTAMINATION
SURFACES
SYNTHETIC MATERIALS
TIME-OF-FLIGHT SPECTROMETERS