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Point-contact tunneling in monophasic and polyphasic Y-Ba-Cu-O samples: Experiment and model

Journal Article · · Phys. Rev. B: Condens. Matter; (United States)
Tunneling experiments using large-area point-contact structures have been performed on several monophasic polycrystalline Ba/sub 2/Cu/sub 3/O/sub 7-//sub delta/ samples and on polyphasic samples containing, mixed with the previous superconducting phase, also about 11% of the so-called green phase (BaY/sub 2/CuO/sub 5/). Both niobium and Y-Ba-Cu-O tips were used as counterelectrodes and measurements were made at 4.2 and 77 K. Results obtained at different experimental conditions show great reproducibility indicating the presence of the gap voltage at about 20 mV in the dynamic resistance curves. A phenomenological model was then developed to interpret in a quantitative way our data by means of a decomposition of the experimental conductance into a background component and a superconducting-tunneling component. The former results essentially in a parabolic contribution versus the bias voltage typical of a tunneling between normallike junction electrodes while the latter component is smeared out in voltage by a large amount of broadening. Using the model in a least-squares fit of the experimental data of Nb/Y-Ba-Cu-O junctions, values V/sub G/ = 21.3 +- 0.8 mV and V/sub G/ = 22.0 +- 0.6 mV for the voltage gaps at 4.2 K of monophasic and polyphasic materials, respectively, have been determined. These results have been well confirmed by measurements on Y-Ba-Cu-O/Y-Ba-Cu-O junctions while, at 77 K, there are no indications of a superconducting tunneling. We obtained also the parameters of the background conductance, which indicates the presence of a nonsuperconducting layer at the surface of the material.
Research Organization:
Dipartimento di Fisica, Politecnico di Torino, Torino, Italy
OSTI ID:
6552479
Journal Information:
Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 39:4; ISSN PRBMD
Country of Publication:
United States
Language:
English