Analog high-bandwidth single-shot data link using integrated optical modulators and a high fidelity optical streak camera
Conference
·
OSTI ID:6547490
We present preliminary data on the fidelity of an analog optical data link operating at 830 nm. This data link encodes an electrical signal on an optical carrier by the action of a commercially available integrated-optic modulator, a 2x2 switch, from Crystal Technology, Inc. (CTI). An optical streak camera is used to record the modulated optical carrier. With this single-shot system a precision of 2--5% is realized. The dynamic range of the system is approximately 30 dB (power). The present system bandwidth is limited to 3 Ghz by the CTI modulator. New modulator designs using travelling wave structures will soon extend the system bandwidth to around 10 Ghz. We discuss the potential for development of a high-fidelity multichannel analog link based upon this technology and the potential impact on instrumentation for the measurement of ultra-fast single-transient phenomena. 5 refs., 10 figs.
- Research Organization:
- Lawrence Livermore National Lab., CA (USA)
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 6547490
- Report Number(s):
- UCRL-100104; CONF-8809105-12; ON: DE89005353
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
440400 -- Well Logging Instrumentation
47 OTHER INSTRUMENTATION
99 GENERAL AND MISCELLANEOUS
990300 -- Information Handling
CAMERAS
DATA
DATA TRANSMISSION SYSTEMS
EQUIPMENT
EXPERIMENTAL DATA
FREQUENCY RANGE
INFORMATION
LASERS
MEASURING INSTRUMENTS
MODULATION
NUMERICAL DATA
OPTICAL EQUIPMENT
PERFORMANCE TESTING
RADIATION DETECTORS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR LASERS
STREAK CAMERAS
TESTING
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
440400 -- Well Logging Instrumentation
47 OTHER INSTRUMENTATION
99 GENERAL AND MISCELLANEOUS
990300 -- Information Handling
CAMERAS
DATA
DATA TRANSMISSION SYSTEMS
EQUIPMENT
EXPERIMENTAL DATA
FREQUENCY RANGE
INFORMATION
LASERS
MEASURING INSTRUMENTS
MODULATION
NUMERICAL DATA
OPTICAL EQUIPMENT
PERFORMANCE TESTING
RADIATION DETECTORS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR LASERS
STREAK CAMERAS
TESTING