Probing convex polygons with X-rays
Journal Article
·
· SIAM J. Comput.; (United States)
- Dept. of Computer Science, Univ. of Illinois at Urbana-Champaign, Urbana, IL (US)
An X-ray probe through a polygon measures the length of intersection between a line and the polygon. This paper considers the properties of various classes of X-ray probes, and shows how they interact to give finite strategies for completely describing convex n-gons. It is shown that (3n/2)+6 probes are sufficient to verify a specified n-gon, while for determining convex polygons (3n-1)/2 X-ray probes are necessary and 5n+O(1) sufficient, with 3n+O(1) sufficient given that a lower bound on the size of the smallest edge of P is known.
- OSTI ID:
- 6544239
- Journal Information:
- SIAM J. Comput.; (United States), Journal Name: SIAM J. Comput.; (United States) Vol. 17:5; ISSN SMJCA
- Country of Publication:
- United States
- Language:
- English
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