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Uncooled thin film infrared imaging device with aerogel thermal isolation: Deposition and planarization techniques

Conference ·
DOI:https://doi.org/10.2172/574204· OSTI ID:654134
; ; ;  [1];  [2];  [3]
  1. Sandia National Labs., Albuquerque, NM (United States)
  2. Univ. of New Mexico, Albuquerque, NM (United States). Dept. of Chemical and Nuclear Engineering
  3. AMMPEC, Inc., Albuquerque, NM (United States)

The authors have successfully integrated a thermally insulating silica aerogel thin film into a new uncooled monolithic thin film infrared (IR) imaging device. Compared to other technologies (bulk ceramic and microbridge), use of an aerogel layer provides superior thermal isolation of the pyroelectric imaging element from the relatively massive heat sinking integrated circuit. This results in significantly higher thermal and temporal resolutions. They have calculated noise equivalent temperature differences of 0.04--0.10 C from a variety of Pb{sub x}Zr{sub y}Ti{sub 1{minus}y}O{sub 3} (PZT) and Pb{sub x}La{sub 1{minus}x}Zr{sub y}Ti{sub 1{minus}y}O{sub 3} (PLZT) pyroelectric imaging elements in monolithic structures. In addition, use of aerogels results in an easier, less expensive fabrication process and a more robust device. Fabrication of these monolithic devices entails sol-gel deposition of the aerogel, sputter deposition of the electrodes, and solution chemistry deposition of the pyroelectric imaging elements. Uniform pyroelectric response is achieved across the device by use of appropriate planarization techniques. These deposition and planarization techniques are described. Characterization of the individual layers and monolithic structure using scanning electron microscopy, atomic force microscopy and Byer-Roundy techniques also is discussed.

Research Organization:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Organization:
USDOE Office of Financial Management and Controller, Washington, DC (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
654134
Report Number(s):
SAND--98-0847C; CONF-980429--; ON: DE98004623; BR: YN0100000
Country of Publication:
United States
Language:
English