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UV photoemission from ZrF/sub 4/

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.328843· OSTI ID:6537454
Photoemission measurements on ZrF/sub 4/ films were made in the photon energy range 10--27 eV. Spectral yield and photoelectron energy distributions were measured. The results indicate that the valence-band width is 5.1 +- 0.2 eV and the photoemission threshold is 13.4 +- 0.2 eV.
Research Organization:
Department of Physics and Astronomy, University of Hawaii, Honolulu, Hawaii 96822
OSTI ID:
6537454
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 52:2; ISSN JAPIA
Country of Publication:
United States
Language:
English