CdTe semiconductor x-ray imaging sensor and energy subtraction method using x-ray energy information

Journal Article · Wed Mar 31 23:00:00 EST 1993 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/23.212323· OSTI ID:6536746

Tsutsui, Hiroshi; Ohtsuchi, Tetsuro; Ohmori, Koichi; Baba, Sueki ^[1]

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1. Matsushita Electric Industrial Co., Ltd., Osaka (Japan)

A multichannel X-ray imaging sensor using a CdTe compound semiconductor radiation detector was developed. Both the digital X-ray imaging and energy information-generating analyzing method were studied. The X-ray imaging sensor consisted of 512 channel CdTe detector elements at a pitch of 0.2 mm. X-ray photons were directly detected using a photon-counting method and high- and low-energy images were obtained simultaneously. The following conclusions were obtained: the specific resolution was obtained over 2.5 line pairs/mm in the channel direction and 1.6 line pairs/mm in the scanning direction with a scanning pitch of 0.2 mm. The energy subtraction method is effective in distinguishing an objects component materials.

• OSTI ID: 6536746
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 40:2; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420500* -- Engineering-- Materials Testing
440101 -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CDTE SEMICONDUCTOR DETECTORS
DESIGN
ELECTROMAGNETIC RADIATION
FEASIBILITY STUDIES
IMAGE INTENSIFIERS
IMAGES
INDUSTRIAL RADIOGRAPHY
IONIZING RADIATIONS
MEASURING INSTRUMENTS
RADIATION DETECTORS
RADIATIONS
SEMICONDUCTOR DETECTORS
X RADIATION
X-RAY RADIOGRAPHY