Ultrafast turnoff laser triggered gating system for microchannel plate intensified x-ray spectrometers
Conference
·
OSTI ID:6532675
A laser triggered photo-conductive switch based microchannel plate (MCP) gating system has been developed. The gating pulse provided to the MCP has a fall time on the order of 200 ps. Use of this sytem has resulted in increased signal to noise ratio on three MCP intensified x-ray spectrometers during recent x-ray laser experiments at the Novette laser facility. The x-ray signals of interest have a duration of approximately 300 ps while background in the same spectral region continues for several nanoseconds. As a result, signal to noise ratio is maximized by turning the MCP off just after the signals of interest are recorded. The MCP's are turned on by charging to approximately 1 kV with a slow risetime (500 ns) pulse and rapidly gated off by a photoconductive switch connected to the MCP through transmission lines. Staggering the turnoff times of three microstrip lines across the MCP by 250 ps provides some time resolution. Details of the system, including pulse charging system, trigger beam delivery optics, and system diagnostics will be discussed.
- Research Organization:
- Lawrence Livermore National Lab., CA (USA)
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 6532675
- Report Number(s):
- UCRL-91227; CONF-841010-23; ON: DE86002600
- Country of Publication:
- United States
- Language:
- English
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Ultrafast turnoff triggered gating system for microchannel-plate intensified x-ray spectrometers
Ultrafast turnoff laser triggered gating system for microchannel-plate intensified x-ray spectrometers
Nanosecond-gating properties of proximity-focused microchannel-plate image intensifiers
Conference
·
Wed May 01 00:00:00 EDT 1985
· Rev. Sci. Instrum.; (United States)
·
OSTI ID:5441676
Ultrafast turnoff laser triggered gating system for microchannel-plate intensified x-ray spectrometers
Journal Article
·
Wed May 01 00:00:00 EDT 1985
· Rev. Sci. Instrum.; (United States)
·
OSTI ID:5639803
Nanosecond-gating properties of proximity-focused microchannel-plate image intensifiers
Conference
·
Wed Dec 31 23:00:00 EST 1980
·
OSTI ID:6505296
Related Subjects
440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
ELECTRIC CONDUCTIVITY
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
ELECTRON MULTIPLIERS
ELECTRON TUBES
ELECTRONIC CIRCUITS
EQUIPMENT
GATING CIRCUITS
LASERS
MEASURING INSTRUMENTS
MICROCHANNEL ELECTRON MULTIPLIERS
PERFORMANCE
PHOTOCONDUCTIVITY
PHYSICAL PROPERTIES
SPECTROMETERS
SWITCHES
X-RAY LASERS
X-RAY SPECTROMETERS
47 OTHER INSTRUMENTATION
ELECTRIC CONDUCTIVITY
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
ELECTRON MULTIPLIERS
ELECTRON TUBES
ELECTRONIC CIRCUITS
EQUIPMENT
GATING CIRCUITS
LASERS
MEASURING INSTRUMENTS
MICROCHANNEL ELECTRON MULTIPLIERS
PERFORMANCE
PHOTOCONDUCTIVITY
PHYSICAL PROPERTIES
SPECTROMETERS
SWITCHES
X-RAY LASERS
X-RAY SPECTROMETERS