Sputtering and luminescence in electronically excited solid argon
Journal Article
·
· Phys. Rev. Lett.; (United States)
We have measured both ultraviolet luminescence and ejection of atomic argon from solid argon films electronically excited by megaelectronvolt light ions. The two phenomena reflect (respectively) the radiative and the nonradiative parts of the energy release during electronic recombination and deexcitation. The measurements can be correlated by a model of diffusion of ionic excitons followed by formation and decay of self-trapped excimers.
- Research Organization:
- Department of Nuclear Engineering and Engineering Physics, University of Virginia, Charlottesville, Virginia 22901
- OSTI ID:
- 6530014
- Journal Information:
- Phys. Rev. Lett.; (United States), Journal Name: Phys. Rev. Lett.; (United States) Vol. 53:6; ISSN PRLTA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
640301* -- Atomic
Molecular & Chemical Physics-- Beams & their Reactions
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ARGON
COLLISIONS
DATA
DE-EXCITATION
DIMENSIONS
ELEMENTS
EMISSION
ENERGY RANGE
ENERGY-LEVEL TRANSITIONS
EXPERIMENTAL DATA
FILMS
FLUIDS
GASES
INFORMATION
INTERATOMIC FORCES
ION COLLISIONS
LUMINESCENCE
MEV RANGE
NONMETALS
NUMERICAL DATA
RARE GASES
RECOMBINATION
SECONDARY EMISSION
SOLIDS
SPECTRA
THICKNESS
THIN FILMS
ULTRAVIOLET SPECTRA
Molecular & Chemical Physics-- Beams & their Reactions
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ARGON
COLLISIONS
DATA
DE-EXCITATION
DIMENSIONS
ELEMENTS
EMISSION
ENERGY RANGE
ENERGY-LEVEL TRANSITIONS
EXPERIMENTAL DATA
FILMS
FLUIDS
GASES
INFORMATION
INTERATOMIC FORCES
ION COLLISIONS
LUMINESCENCE
MEV RANGE
NONMETALS
NUMERICAL DATA
RARE GASES
RECOMBINATION
SECONDARY EMISSION
SOLIDS
SPECTRA
THICKNESS
THIN FILMS
ULTRAVIOLET SPECTRA