Effect of leads and energy gap upon the retrapping current of Josephson junctions

Journal Article · Mon Sep 03 04:00:00 EDT 1990 · Physical Review Letters; (USA)

DOI:https://doi.org/10.1103/PhysRevLett.65.1263· OSTI ID:6528067

Johnson, A T; Lobb, C J; Tinkham, M ^[1]

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1. Department of Physics, Harvard University, Cambridge, MA (USA) Division of Applied Sciences, Harvard University, Cambridge, MA (USA)

We observe that the retrapping current of high-resistance, small-capacitance, superconducting tunnel junctions decreases sharply with decreasing temperature, and then has a puzzling, flat, nonzero minimum at low {ital T}, rather than continuing to decrease as quasiparticle damping freezes out. We explain the crossover by considering the combined admittance of the leads and of the junction (including the onset of pair-breaking tunneling at the gap voltage) at both dc and the Josephson frequency. Our analog simulations and analytic approximations both agree well with the data.

• OSTI ID: 6528067
• Journal Information: Physical Review Letters; (USA), Journal Name: Physical Review Letters; (USA) Vol. 65:10; ISSN PRLTA; ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

426001* -- Engineering-- Superconducting Devices & Circuits-- (1990-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CHALCOGENIDES
CURRENTS
DAMPING
DATA
DIFFERENTIAL EQUATIONS
ELECTRIC CURRENTS
ELECTRONIC CIRCUITS
ELEMENTS
ENERGY LOSSES
EQUATIONS
EQUATIONS OF MOTION
EXPERIMENTAL DATA
FREQUENCY DEPENDENCE
INFORMATION
JOSEPHSON JUNCTIONS
JUNCTIONS
LOSSES
METALS
MIM JUNCTIONS
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
PARTIAL DIFFERENTIAL EQUATIONS
QUASI PARTICLES
SEMICONDUCTOR JUNCTIONS
SUPERCONDUCTING JUNCTIONS
SUPERCONDUCTORS
TEMPERATURE DEPENDENCE
TIN
TIN COMPOUNDS
TIN OXIDES
TRAPPING
TUNNEL EFFECT
ULTRALOW TEMPERATURE