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U.S. Department of Energy
Office of Scientific and Technical Information

Transient protection of electronic circuits. Final report, June 1983-July 1984

Technical Report ·
OSTI ID:6523706

Electromagnetic pulses from nuclear weapons, lightning, and electrostatic discharge are three examples of electrical overstress. Such overstress can cause failure, permanent degradation, or temporary malfunction (upset) of electronic devices and systems. This problem and general solutions are briefly reviewed. Nonlinear components and circuits for protection from electrical overstress are discussed in detail, emphasizing spark gaps, metal oxide varistors, and avalanche diodes. However, other components, such as semiconductor diodes, thyristors, resistors, inductors, and optoisolators are also discussed. Applications of these nonlinear components are discussed in the context of signal lines, AC power lines, and DC power supplies. The final chapter discusses specific upset protection circuits.

Research Organization:
Air Force Weapons Lab., Kirtland AFB, NM (USA)
OSTI ID:
6523706
Report Number(s):
AD-A-178945/2/XAB; AFWL-TR-85-34
Country of Publication:
United States
Language:
English