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Resonant activation of a Josephson junction

Conference ·
OSTI ID:6506793
; ; ;
The lifetime of the zero voltage state of a current-biased Josephson junction is reduced by the application of a weak microwave perturbation at a frequency near the plasma frequency of the junction. We call this process resonant activation. The experimental data are in good agreement with numerical simulations.
Research Organization:
Lawrence Berkeley Lab., CA (USA)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
6506793
Report Number(s):
LBL-18195; CONF-840842-30; ON: DE85000702
Conference Information:
17. international conference on low temperature physics, Karlsruhe, F.R. Germany, 15 Aug 1984
Country of Publication:
United States
Language:
English

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Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CHALCOGENIDES
COMPUTERIZED SIMULATION
DISTURBANCES
ELECTROMAGNETIC RADIATION
ELEMENTS
JOSEPHSON JUNCTIONS
JUNCTIONS
LANGMUIR FREQUENCY
METALS
MICROWAVE RADIATION
NIOBIUM
NIOBIUM COMPOUNDS
NIOBIUM OXIDES
OXIDES
OXYGEN COMPOUNDS
RADIATIONS
REFRACTORY METAL COMPOUNDS
SIMULATION
SUPERCONDUCTING JUNCTIONS
TRANSITION ELEMENT COMPOUNDS
TRANSITION ELEMENTS