Electron paramagnetic resonance and optical study of radiation-induced defect centers in doped silica glasses

Technical Report · Wed Jan 01 00:00:00 EST 1986

OSTI ID:6506206

Schwartz, R N; Tagonan, G L; Blair, G R; Chamulitrat, W; Kevan, L

Gamma- and uv-induced defect centers in germanium- and fluorine-doped silica have been studied by electron paramagnetic resonance (EPR) spectroscopy. The complex spectrum in irradiated germanium doped glass corresponds to a superposition of resonances from several germanium E-centers. In uv-irradiated samples, however, the EPR spectrum is dominated by only one type of germanium E-center. Significant spectral simplification of irradiated germanium doped silica can be achieved by heating or broadband photo-irradiation. Similar results are observed in multimode germanium doped core optical fibers. Uv-induced optical loss spectra in the 0.5-1.5 micrometers wavelength range were also measured in these core fibers as well as the growth kinetics of the uv-induced absorption. Gamma irradiation of fluorine doped silica generated two different types of silicon E-centers, Ea1 and Ea2. At lower radiation dose one sees a mixture of Ea1 and Ea2, but higher radiation dose Ea2 dominates. A spectrum dominated by the Ea2 variant is also observed in uv-irradiated samples and in photobleached low gamma dose samples.

• Research Organization: Hughes Research Labs., Malibu, CA (USA)
• OSTI ID: 6506206
• Report Number(s): AD-A-200815/9/XAB
• Resource Relation: Other Information: Pub. in Proceedings of Materials Research Society Symposium Defects in Glasses, Vol. 61, 197-204(1986)
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
GLASS
PHYSICAL RADIATION EFFECTS
SILICA
CRYSTALLOGRAPHY
DOPED MATERIALS
FIBERS
FLUORINE
GAMMA RADIATION
GERMANIUM
KINETICS
OPTICAL PROPERTIES
SPECTRA
SPECTROSCOPY
CHALCOGENIDES
ELECTROMAGNETIC RADIATION
ELEMENTS
HALOGENS
IONIZING RADIATIONS
MATERIALS
METALS
MINERALS
NONMETALS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
RADIATION EFFECTS
RADIATIONS
SILICON COMPOUNDS
SILICON OXIDES
360206* - Ceramics
Cermets
& Refractories- Radiation Effects