Semiconductors probed by ultrafast laser spectroscopy. Volume 2
Book
·
OSTI ID:6505742
This book contains 17 chapters. Some of the titels are: Picosecond Optoelectronic Measurement of Carrier Transport in Amorphous Silicon; Picosecond Streak Camera Photonics; Applications of Streak Cameras; and Picosecond Fluorescence Spectroscopy in Semiconductors using a Time-Correlated Single-Photon Counting Method.
- OSTI ID:
- 6505742
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360603* -- Materials-- Properties
440300 -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
ABSTRACTS
CAMERAS
CARRIER MOBILITY
CHARGE CARRIERS
COUNTING TECHNIQUES
DIELECTRIC PROPERTIES
DOCUMENT TYPES
ELECTRICAL PROPERTIES
ELECTRO-OPTICAL EFFECTS
ELEMENTS
EMISSION SPECTROSCOPY
FLUORESCENCE SPECTROSCOPY
KERR EFFECT
LEADING ABSTRACT
MATERIALS
MEASURING METHODS
MOBILITY
PHYSICAL PROPERTIES
SEMICONDUCTOR MATERIALS
SEMIMETALS
SILICON
SPECTROSCOPY
360603* -- Materials-- Properties
440300 -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
ABSTRACTS
CAMERAS
CARRIER MOBILITY
CHARGE CARRIERS
COUNTING TECHNIQUES
DIELECTRIC PROPERTIES
DOCUMENT TYPES
ELECTRICAL PROPERTIES
ELECTRO-OPTICAL EFFECTS
ELEMENTS
EMISSION SPECTROSCOPY
FLUORESCENCE SPECTROSCOPY
KERR EFFECT
LEADING ABSTRACT
MATERIALS
MEASURING METHODS
MOBILITY
PHYSICAL PROPERTIES
SEMICONDUCTOR MATERIALS
SEMIMETALS
SILICON
SPECTROSCOPY