A comparative model for improving performance of a precision voltage reference (PVR) in severe radiation environments

Technical Report · Thu Dec 01 04:00:00 EST 1988

OSTI ID:6502094

Campbell, D V

The intent of this study was to develop a method of improving the performance of existing radiation hardened precision voltage references. Study effort focused on the development of a proposed comparative model, which compares the radiation induced shifts of a commercial non-hardened (SOFT) PVR to that of a radiation hardened (HARD) PVR. The model makes it possible to predict the mean shift in the reference PVR versus neutron fluence without actually knowing the fluence. In the study, samples of both SOFT and HARD PVRs were exposed unpowered from 3/center dot/10/sup 12/ neutrons/cm/sup 2/, 1 MeV(Si) equivalent, to 1/center dot/10/sup 15/ neutrons/cm/sup 2/. Data on the samples were collected at temperatures between 0/degree/ and 80/degree/. A simple third order fit applied to the data resulted in better than a 2.3 factor of improvement in the reference PVR at 3/center dot/10/sup 14/ neutrons/cm/sup 2/ and 40/degree/C. The model worked well at cold temperatures where reference PVR changes were smooth; however, at hot temperatures where PVR changes were very nonlinear, insufficient data were available to produce a good fit. Results are calculated for a general form. Adaptation of the model for specific cases would result in greater improvement. The technique developed in the study is also applicable for modeling other phenomena as well. 21 refs., 7 figs., 4 tabs.

• Research Organization: Sandia National Labs., Albuquerque, NM (USA)
• DOE Contract Number: AC04-76DP00789
• OSTI ID: 6502094
• Report Number(s): SAND-88-3186; ON: DE89007534
• Country of Publication: United States
• Language: English

Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COMPARATIVE EVALUATIONS
COMPUTER ARCHITECTURE
DOSIMETRY
ELECTRONIC EQUIPMENT
EQUIPMENT
HARDENING
MEASURING METHODS
PERFORMANCE
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
SEMICONDUCTOR DEVICES
TESTING