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Calculations of atomic sputtering and displacement cross-sections in solid elements by electrons with energies from threshold to 1. 5 MV

Technical Report ·
DOI:https://doi.org/10.2172/6493690· OSTI ID:6493690
The kinetics of knock-on collisions of relativistic electrons with nuclei and details of the numerical evaluation of differential, recoil, and total Mott cross-sections are reviewed and discussed. The effects of electron beam induced displacement and sputtering, in the transmission electron microscope (TEM) environment, on microanalysis are analyzed with particular emphasis placed on the removal of material by knock-on sputtering. The mass loss predicted due to transmission knock-on sputtering is significant for many elements under conditions frequently encountered in microanalysis. Total Mott cross-sections are tabulated for all naturally occurring solid elements up to Z = 92 at displacement energies of one, two, four, and five times the sublimation energy and for accelerating voltages accessible in the transmission electron microscope. Fortran source code listings for the calculation of the differential Mott cross-section as a function of electron scattering angle (dMottCS), as a function of nuclear recoil angle (RECOIL), and the total Mott cross-section (TOTCS) are included. 48 refs., 21 figs., 12 tabs.
Research Organization:
Argonne National Lab., IL (USA)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
6493690
Report Number(s):
ANL-88-48; ON: DE89007538
Country of Publication:
United States
Language:
English

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Related Subjects

640304* -- Atomic
Molecular & Chemical Physics-- Collision Phenomena
74 ATOMIC AND MOLECULAR PHYSICS
ATOM COLLISIONS
BEAMS
CALCULATION METHODS
COLLISIONS
COMPUTER CODES
CROSS SECTIONS
D CODES
DATA
ELECTRON BEAMS
ELECTRON COLLISIONS
ELECTRON MICROSCOPY
ELECTRON-ATOM COLLISIONS
ENERGY RANGE
INFORMATION
LEPTON BEAMS
MEV RANGE
MEV RANGE 01-10
MICROSCOPY
NUMERICAL DATA
PARTICLE BEAMS
R CODES
SCATTERING
SMALL ANGLE SCATTERING
SPUTTERING
T CODES
TABLES
THEORETICAL DATA
TRANSMISSION ELECTRON MICROSCOPY