Single-shot measurement of the amplitude and phase of ultrashort laser pulses in the violet

Journal Article · Sun Jan 01 00:00:00 EST 1995 · Optics Letters; (United States)

DOI:https://doi.org/10.1364/OL.20.000070· OSTI ID:6489778

Clement, T S; Taylor, A J ^[1]; Kane, D J ^[2]

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1. Los Alamos National Laboratory, MS E525, Los Alamos, New Mexico 87545 (United States)
2. Southwest Sciences, Inc., 1570 Pacheco Street, Suite E-11, Santa Fe, New Mexico 87501 (United States)

Using single-shot, self-diffraction, frequency-resolved optical gating, we measure the complete electric field amplitude and phase of 405-nm second-harmonic pulses from an amplified Ti:sapphire system. The single-shot frequency-resolved optical gating device gives both qualitative and quantitative information, which is useful for analyzing and optimizing the grating compressor in the chirped-pulse amplification system.

• OSTI ID: 6489778
• Journal Information: Optics Letters; (United States), Vol. 20:1; ISSN 0146-9592
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
SOLID STATE LASERS
PULSE TECHNIQUES
AMPLIFICATION
DISPERSION RELATIONS
HARMONIC GENERATION
INFRARED RADIATION
ELECTROMAGNETIC RADIATION
FREQUENCY MIXING
LASERS
RADIATIONS
426002* - Engineering- Lasers & Masers- (1990-)