Lorentz microscopy on dynamically written domains in GdTbFe

Journal Article · Sun Mar 05 23:00:00 EST 1989 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.101420· OSTI ID:6485478

Greidanus, F J.A.M.; Jacobs, B A.J.; den Broeder, F J.A.; Spruit, J H.M.; Rosenkranz, M

In this letter a new method for the observation of thermomagnetically written domains using Lorentz electron microscopy is discussed. Domains are written in a GdTbFe layer deposited on a specially prepared silicon wafer disk, provided with Si/sub 3/N/sub 4/ windows. This allows direct observation by Lorentz microscopy of the magnetization patterns dynamically written under recording conditions. It is shown that by locally heating the GdTbFe layer with a continuous laser beam, combined with high-frequency switching of the magnetic field, very high storage densities can be achieved. Domains with a length of 0.25 ..mu..m in the direction of disk rotation could be written.

• Research Organization: Philips Research Laboratories, P. O. Box 80.000, 5600 JA, Eindhoven, The Netherlands
• OSTI ID: 6485478
• Journal Information: Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 54:10; ISSN APPLA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
ALLOYS
DOMAIN STRUCTURE
ELECTRON MICROSCOPY
ELEMENTS
FILMS
GADOLINIUM ALLOYS
IRON ALLOYS
IRON BASE ALLOYS
MAGNETIZATION
MEMORY DEVICES
MICROSCOPY
RARE EARTH ALLOYS
SEMIMETALS
SILICON
TERBIUM ALLOYS