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An XPS study of Cu(x)S formed on Zn(0. 15)Cd(0. 85)S

Journal Article · · J. Electrochem. Soc.; (United States)
DOI:https://doi.org/10.1149/1.2119903· OSTI ID:6477127
During fabrication, cells of the Cu(x)S/Zn(y)Cd(1-y)S type (including Cu(x)S/CdS) receive extensive heat-treatment. It has been found that heat-treatments increase cadmium and zinc concentrations both in and on the Cu(x)S layer. However, most compositional measurements of Cu(x)S/CdS and Cu(x)S/Zn(y)Cd(1-y)S junctions have been only concerned with elemental analyses. In the present investigation, X-ray photoelectron spectroscopy (XPS) combined with ion-milling has been employed to determine the chemical species which exist in and on Cu(x)S layers formed on CdS and ZnCdS substrates, when aged under different conditions. The obtained results provide a contribution to a better understanding of potential degradation mechanisms.
Research Organization:
Virginia Polytechnic Institute and State University, Blacksburg, VA
OSTI ID:
6477127
Journal Information:
J. Electrochem. Soc.; (United States), Journal Name: J. Electrochem. Soc.; (United States) Vol. 130; ISSN JESOA
Country of Publication:
United States
Language:
English