Visualization of x-ray backscatter data
- Geo-Centers, Inc., Fort Washington, MD (United States)
- Naval Research Lab., Washington, DC (United States). Materials Chemistry Branch
Of the several processes which occur when x-rays interact with matter, Compton scattering is dominant in the range of energies commonly used in industrial radiography. The Compton interaction between an x-ray photon and a free or outer shell electron causes the electron to recoil and the photon to be propagated in a new direction with a reduced energy. Regardless of the incident beam energy, some photons are always scattered in the backwards direction. The potential for determining material properties by the detection of x-ray backscatter has been recognized for years. Although work in this area has been eclipsed by the rapid development of computerized tomography (CT), a variety of industrial backscatter imaging techniques and applications have been demonstrated. Backscatter inspection is unique among x-ray methods in its applicability with access to only one side of the object. The authors are currently developing the application of x-ray backscatter tomography (XBT) to the inspection of steel-reinforced rubber sonar domes on US Navy vessels. In this paper, the authors discuss the visualization methods they use to interpret the XBT data. They present images which illustrate the capability of XBT as applied to sonar domes and a variety of other materials and objects. They also demonstrate and discuss the use of several data visualization software products.
- OSTI ID:
- 64645
- Report Number(s):
- CONF-931193--; ISBN 0-931403-23-5
- Country of Publication:
- United States
- Language:
- English
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